Author： Tanner Peter A. Leung Kim-Hung
Publisher： Society for Applied Spectroscopy
ISSN： 0003-7028
Source： Applied Spectroscopy, Vol.50, Iss.5, 1996-05, pp. : 565-571
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Kontoyannis C. G. Bouropoulos N. Dauaher H. H. Bouropoulos C. Vagenas N. V.
Applied Spectroscopy, Vol. 54, Iss. 2, 2000-02 ,pp. :
Access to resources
Recommend
FT-Raman Spectroscopy at 1.339 Micrometers
By Asselin Kelly J. Chase Bruce
Applied Spectroscopy, Vol. 48, Iss. 6, 1994-06 ,pp. :
FT-Raman Spectroscopy: Development and Justification
Applied Spectroscopy, Vol. 40, Iss. 2, 1986-02 ,pp. :
By Aust Jeffrey F. Cooper John B. Wise Kent L. Jensen Brian J.
Applied Spectroscopy, Vol. 53, Iss. 6, 1999-06 ,pp. :