Novel Attenuated Total Reflection Fourier Transform Infrared Microscopy Using a Gem Quality Diamond as an Internal Reflection Element

Author: Ekgasit Sanong   Thongnopkun Pimthong  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.59, Iss.10, 2005-10, pp. : 1236-1241

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