Near-Infrared Spectroscopy for Monitoring Wafer Etchant Solution Using a Teflon Tube

By Lee Youngbok   Nah Sanghee   Namkung Hankyu   Chung Hoeil  

Applied Spectroscopy, Vol. 59, Iss. 7, 2005-07 ,pp. : 952-955

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Feasibility of a Wide Area Illumination Scheme for Reliable Raman Measurement of Petroleum Products

By Kim Jaejin   Han Jintae   Noh Jaegeun   Chung Hoeil  

Applied Spectroscopy, Vol. 61, Iss. 7, 2007-07 ,pp. : 686-693

Society for Applied Spectroscopy

Access to resources Recommend Favorite

A Simple Method for Determining the Lower Critical Solution Temperature of Polymer Blends Using a Raman Spectrometer

By Coleman M. M.   Skrovanek D. J.   Painter P. C.  

Applied Spectroscopy, Vol. 38, Iss. 3, 1984-05 ,pp. : 448-450

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Simple Procedure for Measurement of Surface-Enhanced Raman Scattering Spectra with NearInfrared Excitation on Silver Particles from Silver Chloride

By Volka Karel   Schrader Bernhard  

Applied Spectroscopy, Vol. 51, Iss. 2, 1997-02 ,pp. : 285-288

Society for Applied Spectroscopy

Access to resources Recommend Favorite

RELATIONSHIP BETWEEN WETTING OF TEFLON BY CETYLTRIMETHYLAMMONIUM BROMIDE SOLUTION AND ADSORPTION

By JANCZUK B.   ZDZIENNICKA A.   WOJCIK W.  

European Polymer Journal, Vol. 33, Iss. 7, 1997-07 ,pp. : 1093-1098

Elsevier

Access to resources Recommend Favorite