Overcoming negativity problems for Cramer-von Mises variance estimators

Author: Alexopoulos Christos   Chang Byeong-Yun   Goldsman David   Lee Sungjoo   Marshall William S.  

Publisher: Inderscience Publishers

ISSN: 1740-2123

Source: International Journal of Simulation and Process Modelling, Vol.4, Iss.1, 2008-10, pp. : 1-6

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Abstract