Residual stress determination and defect detection using electronic speckle pattern interferometry

Author: Gryzagoridis J   Findeis D   Tait R B  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.47, Iss.2, 2005-02, pp. : 91-94

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract