PEC: Computation of coil-induced voltage due to a defect-free plate using Stehfest's method for pulsed eddy current evaluation

Author: Fan Mengbao   Cao Binghua   Wang Yuqiao  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.52, Iss.6, 2010-06, pp. : 302-304

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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