Preparation of TEM samples by focused ion beam (FIB) techniques: applications to the study of clays and phyllosilicates in meteorites

Author： Lee M. R. Bland P. A. Graham G.

Publisher： Mineralogical Society

ISSN： 0026-461X

Source： Mineralogical Magazine, Vol.67, Iss.3, 2003-06, pp. : 581-592

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