

Author: Nitzsche R. P. Percival J. B. Torrance J. K. Stirling J. A. R. Bowen J. T.
Publisher: Mineralogical Society
ISSN: 1471-8030
Source: Clay Minerals, Vol.43, Iss.4, 2008-12, pp. : 549-560
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content










X‐ray diffraction by phase diffraction gratings
JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 4, 2015-08 ,pp. :