Numerical simulation approach on stress and strain for chip scale package under thermal cycling

Author: Ping Yang   Li Wei  

Publisher: Inderscience Publishers

ISSN: 1368-2148

Source: International Journal of Manufacturing Technology and Management, Vol.18, Iss.3, 2009-06, pp. : 300-307

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract