Selecting parameters of discrete scanning systems for digital X-ray imaging

Author: Lebedev M.   Sidulenko O.   Udod V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1061-8309

Source: Russian Journal of Nondestructive Testing, Vol.42, Iss.11, 2006-11, pp. : 765-771

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Abstract