Low-temperature pulsed CVD of thin layers of metallic ruthenium for microelectronics and nanoelectronics. Part 3: Nucleation phenomena during the growth of ruthenium layers

Author: Vasilyev V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7397

Source: Russian Microelectronics, Vol.39, Iss.4, 2010-07, pp. : 262-272

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content