Atomic resolution analyses of nano-structured materials by atom probe tomography

Author： Pareige P.   Cadel E.   Sauvage X.   Deconihout B.   Blavette D.   Mangelinck D.  

Publisher： Inderscience Publishers

ISSN： 1475-7435

Source： International Journal of Nanotechnology, Vol.5, Iss.6-7, 2008-06, pp. : 592-608

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