Analysis of the low-frequency dispersion of the dielectric parameters in AsxSe1-x amorphous layers

Author: Bordovskii V.   Grabko G.   Castro R.   Taturevich T.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1087-6596

Source: Glass Physics and Chemistry, Vol.32, Iss.5, 2006-10, pp. : 529-532

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Abstract