Secondary ion mass spectrometry and scanning electron microscopy characterisation of grain boundary oxide ridges in 9Cr–1Mo steels having different silicon contents, and influence of grain size on scale spalling

By Singh Raman R. K.   Tyagi A. K.   Krishan K.   Gnanamoorthy J. B.  

Materials Science and Technology, Vol. 10, Iss. 7, 1994-07 ,pp. : 592-598

Maney Publishing

Access to resources Recommend Favorite

Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

By Janssens K. G. F.   Van der Biest O.   Vanheliemont J.   Maes H. E.   Hull R.   Bean J. C.  

Materials Science and Technology, Vol. 11, Iss. 1, 1995-01 ,pp. : 66-71

Maney Publishing

Access to resources Recommend Favorite

Foil thickness measurements in transmission electron microscope

By Scott V. D.   Love G.  

Materials Science and Technology, Vol. 3, Iss. 8, 1987-08 ,pp. : 600-608

Maney Publishing

Access to resources Recommend Favorite

LIGHT ELEMENT WAVELENGTH DISPERSIVE X-RAY ANALYSIS IN SCANNING ELECTRON MICROSCOPE

By Hall M. G.  

Surface Engineering, Vol. 9, Iss. 3, 1993-01 ,pp. : 205-212

Maney Publishing

Access to resources Recommend Favorite

Charging of gold/metal oxide/gold nanocapacitors in a scanning electron microscope

By Coutts Michael J   Zareie Hadi M   Cortie Michael B   McDonagh Andrew M  

Nanotechnology, Vol. 25, Iss. 15, 2014-04 ,pp. : 155703-155709

IOP Publishing

Access to resources Recommend Favorite