High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems

Author： Oliver R. A.   Galtrey M. J.   Humphreys C. J.  

Publisher： Maney Publishing

ISSN： 1743-2847

Source： Materials Science and Technology, Vol.24, Iss.6, 2008-06, pp. : 675-681

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