Effect of Si target sputtering power on diffusion barrier properties of Ta–Si–N thin films

Author: Zhou J. C.   Liu Z.   Li Y. Z.   Luo D. T.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.25, Iss.3, 2009-03, pp. : 419-424

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Abstract