Particle induced X-ray emission spectroscopic (PIXE) and surface morphological (AFM) studies on electron beam evaporated WO3 thin films

Author: Sivakumar R.   Ganesan V.   Vijayan V.   Jayachandran M.   Sanjeeviraja C.  

Publisher: Maney Publishing

ISSN: 1743-2944

Source: Surface Engineering, Vol.21, Iss.4, 2005-08, pp. : 315-319

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