Determination of the von Klitzing constant and the fine-structure constant through a comparison of the quantized Hall resistance and the ohm derived from the NIST calculable capacitor

Author： Jeffery A.   Elmquist R. E.   Shields J. Q.   Lee L. H.   Cage M. E.   Shields S. H.   Dziuba R. F.  

Publisher： IOP Publishing

ISSN： 0026-1394

Source： Metrologia, Vol.35, Iss.2, 1998-05, pp. : 83-96

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