Comparison of quantum Hall effect resistance standards of the NIST and the BIPM

Author： Delahaye F.   Witt T. J.   Elmquist R. E.   Dziuba R. F.  

Publisher： IOP Publishing

ISSN： 0026-1394

Source： Metrologia, Vol.37, Iss.2, 2000-07, pp. : 173-176

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