Computerized Control and Operation of Rutherford Backscattering/Channeling for an in situ Ion Beam System and Its Application for Measurement of Si(001) and ZnO(001)

Author： Jun He   Lee J. C.   Ming Li   Ze-Song Wang   Chuan-Sheng Liu   De-Jun Fu  

Publisher： IOP Publishing

ISSN： 0256-307X

Source： Chinese Physics Letters, Vol.28, Iss.1, 2011-01, pp. : 12901-12904

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