Dislocation and Elastic Strain in an InN Film Characterized by Synchrotron Radiation X-Ray Diffraction and Rutherford Backscattering/Channeling

Author： Feng-Feng Cheng   Tao Fa   Xin-Qiang Wang   Shu-De Yao  

Publisher： IOP Publishing

ISSN： 0256-307X

Source： Chinese Physics Letters, Vol.29, Iss.2, 2012-02, pp. : 26101-26104

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