Author: Richters J P Kalden J Gnauck M Ronning C Dietrich C P von Wenckstern H Grundmann M Gutowski J Voss T
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.27, Iss.1, 2012-01, pp. : 15005-15009
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Abstract
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