Author: Chichibu S F Kagaya M Corfdir P Ganière J-D Deveaud-Plédran B Grandjean N Kubo S Fujito K
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.27, Iss.2, 2012-02, pp. : 24008-24014
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Abstract