Common path Michelson interferometer based on multiple reflections within the sample arm: sensor applications and imaging artefacts

Author： Krstajić Nikola   Childs David   Smallwood Rod   Hogg Richard   Matcher Stephen J  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.22, Iss.2, 2011-02, pp. : 27002-27007

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