Device Characterization Using Variable Rectilinear Interpolation

Author: Yeung C.T.   Lin Bob  

Publisher: Society for Imaging Science and Technology

ISSN: 2166-9635

Source: Color and Imaging Conference, Vol.1997, Iss.1, 1997-01, pp. : 193-196

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract