Author: Chi Meng-Chun Chou Wei-Mou Wang Chih-Hsien Chen Wenlung Hsu Wen-Hwei Lin Long-Liu
Publisher: Springer Publishing Company
ISSN: 0003-6072
Source: Antonie van Leeuwenhoek, Vol.86, Iss.4, 2005-01, pp. : 355-362
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