XPS Studies of Gd2Fe12Si2B Thin Films

Author: Smardz L.   Kowalczyk A.   Toliński T.   Gościańska I.  

Publisher: Springer Publishing Company

ISSN: 0011-4626

Source: Czechoslovak Journal of Physics, Vol.54, Iss.4, 2004-12, pp. : 233-236

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content