Photoelectron spectroscopy study of Mn/n-Si interfacial structure

Author： Srivastava M.   Shripathi T.   Srivastava P.  

Publisher： Springer Publishing Company

ISSN： 0957-4522

Source： Journal of Materials Science: Materials in Electronics, Vol.24, Iss.12, 2013-12, pp. : 5166-5174

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