Quantitative analysis of SiC polytype distributions by the Rietveld method

Author: Hongchao L.   Changlin K.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.32, Iss.10, 1997-10, pp. : 2661-2664

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract