Influence of oxygen and post deposition annealing on the electrical properties of MnPc and MnPcCl Schottky barrier devices

Author: Rajesh K.   Menon C.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.40, Iss.5, 2005-03, pp. : 1115-1120

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