Nanosecond time resolved electron diffraction studies of the α→β in pure Ti thin films using the dynamic transmission electron microscope (DTEM)

Author: LaGrange Thomas   Campbell Geoffrey H.   Colvin Jeffrey D.   Reed Bryan   King Wayne E.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.41, Iss.14, 2006-07, pp. : 4440-4444

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