Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

Author: Jenkins M.   Zhou Z.   Dudarev S.   Sutton A.   Kirk M.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.41, Iss.14, 2006-07, pp. : 4445-4453

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Abstract