In-situ X-ray-diffraction studies of hydrogenated nanocrystalline gadolinium films

By Shalaan E.   Ehses K.-H.   Schmitt H.  

Journal of Materials Science, Vol. 41, Iss. 22, 2006-11 ,pp. : 7454-7458

Springer Publishing Company

Access to resources Recommend Favorite

In-situ high temperature X-ray diffraction study of Co/SiC interface reactions

By Fujimura T.    

Journal of Materials Science, Vol. 34, Iss. 23, 1999-12 ,pp. : 5743-5747

Springer Publishing Company

Access to resources Recommend Favorite

In-situ high temperature X-ray diffraction study of Fe/Al2O3 interface reactions

By Fujimura T.    

Journal of Materials Science, Vol. 34, Iss. 3, 1999-02 ,pp. : 425-429

Springer Publishing Company

Access to resources Recommend Favorite

Scanning electron microscopy and energy dispersive X-ray study of a recovered dental implant

By Otulakowska Justyna   Nicholson John  

Journal of Materials Science: Materials in Medicine, Vol. 17, Iss. 3, 2006-03 ,pp. : 277-279

Springer Publishing Company

Access to resources Recommend Favorite

Accuracy of energy dispersive x-ray composition analysis of YBCO films on yttrium-containing substrates as compared to Rutherford backscattering spectroscopy

By Mustapha Z.   Chan S-W.   Lam A.   Gerhardt R.  

Journal of Materials Science, Vol. 35, Iss. 2, 2000-01 ,pp. : 443-448

Springer Publishing Company

Access to resources Recommend Favorite