Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K

Author: Okuno T.   Saka H.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.48, Iss.1, 2013-01, pp. : 115-124

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract