Contributions of the environmental scanning electron microscope and X-ray diffraction in investigating the structural evolution of a SiO2 aggregate attacked by alkali-silica reaction

Author: Verstraete J.   Khouchaf L.   Tuilier M. H.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.39, Iss.20, 2004-10, pp. : 6221-6226

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