Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy

Author： Kumar Sanjiv Ramana J. V. Kumar S. Vikram Raju V. S.

Publisher： Springer Publishing Company

ISSN： 0236-5731

Source： Journal of Radioanalytical and Nuclear Chemistry, Vol.265, Iss.3, 2005-08, pp. : 441-446

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Application of secondary ion mass spectrometry for analyzing the composition and structure of surface layers of fine materials

By Ivanov V.

Journal of Structural Chemistry, Vol. 51, Iss. 1, 2010-12 ,pp. : 53-58

Springer Publishing Company

Access to resources Recommend Favorite

Determination of the morphology factor of oxide layers

By Da Silva L.M. De Faria L.A. Boodts J.F.C.

Electrochimica Acta, Vol. 47, Iss. 3, 2001-10 ,pp. : 395-403

Elsevier

Access to resources Recommend Favorite

Quantitative Determination of Zirconium Hydride in a Zirconium Oxide Matrix by Neutron Vibrational Spectroscopy

By Glagolenko I. Y. Carney K. P. Kern S. Goremychkin E. A.

Applied Spectroscopy, Vol. 56, Iss. 7, 2002-07 ,pp. : 942-947

Society for Applied Spectroscopy

Access to resources Recommend Favorite

X-Ray Fluorescence Determination of Composition and Thickness of Nickel–Iron–Cobalt Thin Films: Application of Solution Techniques

By Cocozza E. P. Ferguson A.

Applied Spectroscopy, Vol. 21, Iss. 5, 1967-09 ,pp. : 286-290

Society for Applied Spectroscopy

Access to resources Recommend Favorite

IR spectroscopic determination of the refractive index and thickness of hydrogenated silicon layers

By Timoshenkov S. Pelipas V. Simonov B. Britkov O. Kalugin V.

Inorganic Materials, Vol. 47, Iss. 6, 2011-06 ,pp. : 575-578

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite