Atomic force microscopy (AFM) study on potassium hexatitanate whisker (K₂O·6TiO₂)

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Journal of Materials Science, Vol. 38, Iss. 17, 2003-09 ,pp. : 3641-3646

Springer Publishing Company

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Atomic force microscopy study on the anatase crystallization of long term stored Al2O3-TiO2-SiO2 coatings on glass

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Cracking mechanism in AlN(11—20)/α-Al2O3(1—102) heteroepitaxial films grown by MOCVD

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Evaluation of surface characteristics of dental composites using profilometry, scanning electron, atomic force microscopy and gloss-meter

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Journal of Materials Science: Materials in Medicine, Vol. 18, Iss. 1, 2007-01 ,pp. : 155-163

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Preparation, electrochemical, photoelectrochemical and solid-state characteristics of indium-incorporated TiO2 thin films for solar cell fabrication

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