Tungsten-oxide thin films as novel materials with high sensitivity and selectivity to NO2, O3 and H2S. Part I: Preparation and microstructural characterization of the tungsten-oxide thin films

Author: Berger O.   Fischer W.-J.   Melev V.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.15, Iss.7, 2004-07, pp. : 463-482

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract