Surface roughness and interface engineering for gate dielectrics on strained layers

Author: Maiti C.   Samanta S.   Bera M.   Chattopadhyay S.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.17, Iss.9, 2006-09, pp. : 711-722

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Abstract