Analysis of the (100)Si/LaAlO3 structure by electron spin resonance: nature of the interface

Author： Clémer K.   Stesmans A.   Afanas’ev V.   Edge L.   Schlom D.  

Publisher： Springer Publishing Company

ISSN： 0957-4522

Source： Journal of Materials Science: Materials in Electronics, Vol.18, Iss.7, 2007-07, pp. : 735-741

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