X-ray line profile analysis—An ideal tool to quantify structural parameters of nanomaterials

Author： Kerber Michael   Zehetbauer Michael   Schafler Erhard   Spieckermann Florian   Bernstorff Sigrid   Ungar Tamas  

Publisher： Springer Publishing Company

ISSN： 1543-1851

Source： JOM, Vol.63, Iss.7, 2011-07, pp. : 61-70

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