High-energy diffraction microscopy at the advanced photon source

Author： Lienert U.   Li S.   Hefferan C.   Lind J.   Suter R.   Bernier J.   Barton N.   Brandes M.   Mills M.   Miller M.   Jakobsen B.   Pantleon W.  

Publisher： Springer Publishing Company

ISSN： 1543-1851

Source： JOM, Vol.63, Iss.7, 2011-07, pp. : 70-77

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