Edge-to-edge interfaces in Ti−Al modeled with the embedded atom method

ISSN： 1543-1940

Source： Metallurgical and Materials Transactions A, Vol.37, Iss.12, 2006-03, pp. : 865-871

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Edge-To-Edge Interfaces in Ti-Al Modeled with the Embedded Atom Method

By Reynolds W.T. Farkas D.

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 865-871

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-edge matching—The fundamentals

By Kelly P. Zhang M.

Metallurgical and Materials Transactions A, Vol. 37, Iss. 12, 2006-03 ,pp. : 833-839

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-Edge Matching—The Fundamentals

By Kelly P.M. Zhang M.-X.

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 833-839

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-Edge Matching of Lattice Planes and Coupling of Crystallography and Migration Mechanisms of Planar Interfaces

By Nie J.F.

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 841-849

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-edge matching of lattice planes and coupling of crystallography and migration mechanisms of planar interfaces

By Nie J.

Metallurgical and Materials Transactions A, Vol. 37, Iss. 12, 2006-03 ,pp. : 841-849

Springer Publishing Company

Access to resources Recommend Favorite