Modeling and Simulation of Electron Injection during Programming in Twin FlashTM Devices Based on Energy Transport and the Non-Local Lucky Electron Concept

Author: Hagenbeck R.   Decker S.   Lau F.   Haibach P.   Schley J.-M.   Isler M.   Mikolajick T.   Tempel G.  

Publisher: Springer Publishing Company

ISSN: 1569-8025

Source: Journal of Computational Electronics, Vol.3, Iss.3-4, 2004-10, pp. : 239-242

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