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Springer Publishing Company

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Intrinsic Parameter Fluctuations in Conventional MOSFETs at the Scaling Limit: A Statistical Study

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Study of self-heating effects in SOI and conventional MOSFETs with electro-thermal particle-based device simulator

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Modeling Fully Depleted SOI MOSFETs in 3D Using Recursive Scattering Matrices: Special Issue on the Proceedings of the INTERNATIONAL WORKSHOP ON COMPUTATIONAL ELECTRONICS (IWCE-9)

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GaAs X-ray detector characterization through a 3D finite element model

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