Retention Property Analysis of Epitaxially Grown YMnO3/Y2O3/Si Capacitor

Author: Ito Daisuke   Fujimura Norifumi   Kakuno Kosuke   Ito Taichiro  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.271, Iss.1, 2002-01, pp. : 87-92

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