Author： TASCU S. REEVES R. J. JACQUIER B. MORETTI P. MONTEREALI R. M. PICCININI M. SOMMA F. SEASSAL C.
Publisher： Taylor & Francis Ltd
ISSN： 1042-0150
Source： Radiation Effects and Defects in Solids, Vol.157, Iss.6-12, 2002-01, pp. : 691-694
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Abstract
Electron-beam lithography has been used to define color center stripes of about one hundred micrometers length and variable width (100 nm to 5 µm) in lithium fluoride. These structures have for the first time been illustrated and spectrally characterized in near field optical microscopy (SNOM) operating in local illumination mode with an optical fiber probe and far field fluorescence detection.
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