Controlled ion track etching

Author: George J.   Irkens M.   Neumann S.   Scherer U.   Srivastava A.   Sinha D.   Fink D.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.161, Iss.3, 2006-03, pp. : 161-175

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Abstract