IN SITU X-RAY PROBES FOR PIEZOELECTRICITY IN EPITAXIAL FERROELECTRIC CAPACITORS

Author: DO DAL-HYUN   GRIGORIEV ALEXEI   KIM DONG   EOM CHANG-BEOM   EVANS PAUL   DUFRESNE ERIC  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.101, Iss.1, 2008-01, pp. : 174-181

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Abstract