Author: Chen J. Lam K. H. Dai J. Y. Zhang C. Zhang Z. T. Feng G. P.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.139, Iss.1, 2012-12, pp. : 116-122
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract